IXGT28N90B Datasheet and Replacement

IXGH 28N90B VCES = 900 VHiPerFASTTM IGBTIXGT 28N90B IC25 = 51 AVCE(SAT) = 2.7 VPreliminary data sheettfi(typ) = 130 nsSymbol Test Conditions Maximum Ratings TO-247 AD(IXGH)VCES TJ = 25C to 150C 900 VVCGR TJ = 25C to 150C; RGE = 1 MW 900 VC (TAB)VGES Continuous 20 VGCVGEM Transient 30 VEIC25 TC = 25C51 AIC110 TC = 110C28 ATO-268 (D3)ICM TC =

Low VCE(sat) IGBT IXGH 28N60B VCES = 600 VIXGT 28N60B IC25 = 40 AVCE(sat) = 2.0 VSymbol Test Conditions Maximum Ratings TO-268(IXGT)VCES TJ = 25C to 150C 600 VGVCGR TJ = 25C to 150C; RGE = 1 M 600 VC (TAB)EVGES Continuous 20 VVGEM Transient 30 VTO-247 ADIC25 TC = 25C40 A(IXGH)IC90 TC = 90C28 AICM TC = 25C, 1 ms 80 AC (TAB)SSOA VGE = 15 V,

IXGH 28N30BVCES = 300 VHiPerFASTTM IGBTIXGT 28N30BIC25 = 56 AVCE(sat)typ = 2.1 Vtfi(typ) = 55 nsSymbol Test Conditions Maximum Ratings TO-247 AD (IXGH)VCES TJ = 25 C to 150 C 300 VVCGR TJ = 25 C to 150 C; RGE = 1 M 300 VVGES Continuous 20 VGVGEM Transient 30 V CEIC25 TC = 25 C56 ATO-268IC90 TC = 90 C28 A(IXGT)ICM TC = 25 C, 1 ms 112 AGSSOA VGE= 15 V, TV

IXGH 28N30A VCES = 300 VHiPerFASTTM IGBTIXGT 28N30A IC25 = 56 AVCE(sat)typ = 1.85 Vtfi(typ) = 120 nsPreliminary dataTO-247 AD (IXGH)Symbol Test Conditions Maximum RatingsVCES TJ = 25 C to 150 C 300 VGVCGR TJ = 25 C to 150 C; RGE = 1 M 300 VC(TAB)EVGES Continuous 20 VVGEM Transient 30 VTO-268(IXGT)IC25 TC = 25 C56 AIC90 TC = 90 C28 A GEICM TC = 25 C, 1

IXGH 28N120B VCES = 1200 VHigh Voltage IGBTIXGT 28N120B IC25 = 50 AVCE(sat) = 3.5 Vtfi(typ) = 160 nsSymbol Test Conditions Maximum Ratings TO-268 (IXGT)VCES TJ = 25C to 150C 1200 VVCGR TJ = 25C to 150C; RGE = 1 M 1200 VGVGES Continuous 20 VEC (TAB)VGEM Transient 30 VIC25 TC = 25C50 ATO-247 AD (IXGH)IC110 TC = 110C28 AICM TC = 25C, 1 ms 150 A

Low VCE(sat) IXGH 28N60BD1 VCES = 600 VIGBT with Diode IXGT 28N60BD1 IC25 = 40 AVCE(sat) = 2.0 VPreliminary dataSymbol Test Conditions Maximum Ratings TO-268(IXGT)VCES TJ = 25C to 150C 600 VGVCGR TJ = 25C to 150C; RGE = 1 MW 600 VEVGES Continuous 20 VC (TAB)VGEM Transient 30 V TO-247 AD(IXGH)IC25 TC = 25C40 AIC90 TC = 90C28 AICM TC = 25C, 1 ms 8

Low VCE(sat) IXGH 28N60BD1 VCES = 600 VIGBT with Diode IXGT 28N60BD1 IC25 = 40 AVCE(sat) = 2.0 VCombi PackSymbol Test Conditions Maximum Ratings TO-268(IXGT)VCES TJ = 25C to 150C 600 VGVCGR TJ = 25C to 150C; RGE = 1 M 600 VC (TAB)EVGES Continuous 20 VVGEM Transient 30 V TO-247 AD(IXGH)IC25 TC = 25C40 AIC90 TC = 90C28 AICM TC = 25C, 1 ms 80 A

IXGH 28N30 VCES = 300 VHiPerFASTTM IGBTIXGT 28N30 IC25 = 56 AVCE(sat)typ = 1.6 Vtfi(typ) = 180 nsPreliminary dataSymbol Test Conditions Maximum Ratings TO-268(IXGT)VCES TJ = 25 C to 150 C 300 VVCGR TJ = 25 C to 150 C; RGE = 1 M 300 VGEVGES Continuous 20 V(TAB)VGEM Transient 30 VIC25 TC = 25 C56 ATO-247 ADIC90 TC = 90 C28 AICM TC = 25 C, 1 ms 112 ASSOA VGE

IXGH 28N120B VCES = 1200 VHigh Voltage IGBTIXGT 28N120B IC25 = 50 AVCE(sat) = 3.5 Vtfi(typ) = 160 nsSymbol Test Conditions Maximum Ratings TO-268 (IXGT)VCES TJ = 25C to 150C 1200 VVCGR TJ = 25C to 150C; RGE = 1 M 1200 VGVGES Continuous 20 VEC (TAB)VGEM Transient 30 VIC25 TC = 25C50 ATO-247 AD (IXGH)IC110 TC = 110C28 AICM TC = 25C, 1 ms 150 A

High Voltage IGBT VCES = 1200VIXGH28N120BD1w/ Diode IC25 = 50AIXGT28N120BD1VCE(sat) 3.5Vtfi(typ) = 170nsTO-247AD (IXGH)Symbol Test Conditions Maximum RatingsGVCES TJ = 25C to 150C 1200 VCE (TAB)VCGR TJ = 25C to 150C, RGE = 1M 1200 VVGES Continuous 20 VTO-268 (IXGT)VGEM Transient 30 VIC25 TC = 25C ( Chip Capability ) 50 AI