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Tin Far Electronic CO.,LTDPage No: 2/6Characteristics (Ta=25C)Symbol Min. Typ. Max. Unit Test ConditionsBV 75 - - V I =10A CBO CBV 40 - - V I =10mA CEO CBV 6 - - V I =10A EBO EI - - 10 nA V =60V CBO CBI - - 10 nA V =60V, V =-3V CEX CE BEI - - 10 nA V =3V EBO EB*V 1 - - 0.5 V I =380mA, I =10mA CE(sat) C B*V 2 - - 0.4 V I =150mA, I =15mA CE(sat) C B*V 3 - - 0.75 V I =500mA, I =50mA CE(sat) C B*V 1 0.75 - 0.95 V I =150mA, I =15mA BE(sat) C B*V 2 - - 1.2 V I =500mA, I =50mA BE(sat) C B*h 1 85 - - V =1V, I =0.1mA FE CE C*h 2 90 - - V =1V, I =1mA FE CE C*h 3 95 - - V =1V, I =10mA FE CE C*h 4 100 - 300 V =1V, I =150mA FE CE C*h 5 40 - - V =2V, I =500mA FE CE Cf 300 - - MHz V =5V, I =20mA, f=100MHz T CE CCob - 6 - pF V =5V, f=1MHz CB*Pulse Test: Pulse Width 380s, Duty Cycle2% Ordering Information