The documentation and process conversion measures INCH-POUND necessary to comply with this document shall be MIL-PRF-19500/660E completed by 6 February 2014. 6 December 2013 SUPERSEDING MIL-PRF-19500/660D 11 February 2013 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, FIELD EFFECT RADIATION HARDENED TRANSISTOR, P-CHANNEL SILICON, TYPES 2N7424, 2N7425, AND 2N7426

PD - 93858IRHM9260JANSR2N7426200V, P-CHANNEL RADIATION HARDENEDREF: MIL-PRF-19500/660 POWER MOSFET RAD-Hard HEXFET TECHNOLOGY THRU-HOLE (TO-254AA)Product Summary Part Number Radiation Level RDS(on) ID QPL Part Number IRHM9260 100K Rads (Si) 0.160 -27A JANSR2N7426 IRHM93260 300K Rads (Si) 0.160 -27A JANSF2N7426 TO-254AAInternational Rectifiers RAD-Hard

Provisional Data Sheet No. PD-9.1395I T TI T T T I T Product Summary-200 Volt, 0.8 RAD HARD HEXFET, International Rectifiers P-Channel RAD HARD technologyPart Number BVDSS RDS(on) IDHEXFETs demonstrate excellent threshold voltage stabilityand breakdown voltage stability at total radiation doses asIRHM9230 -200V 0.8 -6.5Ahigh as 105 Rads (Si).

PD - 91299CIRHM9250JANSR2N7423RADIATION HARDENED200V, P-CHANNELPOWER MOSFETREF: MIL-PRF-19500/662THRU-HOLE (T0-254AA) RAD-Hard HEXFET TECHNOLOGYProduct SummaryPart Number Radiation Level RDS(on) ID QPL Part NumberIRHM9250 100K Rads (Si) 0.315 -14A JANSR2N7423IRHM93250 300K Rads (Si) 0.315 -14A JANSF2N7423International Rectifiers RAD-Hard HEXFET technol-

The documentation and process conversion INCH-POUND measures necessary to comply with this revision MIL-PRF-19500/662F shall be completed by 9 August 2014. w/AMENDMENT 1 9 May 2014 SUPERSEDING MIL-PRF-19500/662F 10 December 2013 PERFORMANCE SPECIFICATION SHEET SEMICONDUCTOR DEVICE, TRANSISTOR, FIELD EFFECT RADIATION HARDENED P-CHANNEL, SILICON, TYPES 2N7422, 2N7422U