Bipolar Junction Transistor Parameters and How They Relate
1. Static Parameters (DC)
| Parameter | Symbol | Description | Example for BC547 | Example for 2N3055 |
|---|---|---|---|---|
| DC Current Gain (Base) | hFE, β | Ratio of DC collector current to DC base current in active mode. Depends on current and temperature. | 100-400 (typ. 200) | 20-70 (typ. 50) |
| DC Current Gain (Emitter) | α | Ratio of collector current to emitter current: α = β/(β+1) | 0.99-0.997 | 0.95-0.986 |
| Collector-Emitter Saturation Voltage | Vce(sat) | Voltage drop between collector and emitter in saturation mode | 0.2 V at Ic=10 mA | 0.5-1 V at Ic=3 A |
| Base-Emitter Saturation Voltage | Vbe(sat) | Voltage drop across the B-E junction in saturation mode | 0.7-0.9 V | 1.2-1.5 V |
| Cut-in Voltage | Vbe(on) | B-E junction voltage required to start conduction | ~0.6-0.7 V | ~0.7 V |
| Collector Cut-off Current | Icbo | Leakage current through the reverse-biased collector-base junction with emitter open. Increases with temperature. | < 15 nA (at 25°C) | < 1 mA (at 25°C) |
| Emitter Cut-off Current | Iebo | Leakage current through the emitter-base junction with collector open. Usually very small. | < 100 nA | - |
2. Dynamic Parameters (Small-Signal)
| Parameter | Symbol | Description | Example for BC547 |
|---|---|---|---|
| AC Current Gain | hfe, β | Ratio of small changes in collector current to base current | 200-400 |
| Input Impedance | hie | AC signal resistance between base and emitter | 5 kΩ at Ic=1 mA |
| Collector-Base Capacitance | Ccb, Cc, Cob | Barrier capacitance of the reverse-biased C-B junction | 3-5 pF |
| Transition Frequency | fT | Frequency at which the current gain drops to unity | 300 MHz |
3. Maximum Ratings
| Parameter | Symbol | Description | BC547 | 2N3055 |
|---|---|---|---|---|
| Collector-Emitter Breakdown Voltage | Vceo | Voltage between C and E with base open | 45 V | 60 V |
| Maximum Collector Current | Ic(max) | Maximum allowable continuous collector current | 100 mA | 15 A |
| Maximum Power Dissipation | Pc(max), Pd | Maximum power the package can dissipate (at T=25°C). Decreases with rising temperature! | 500 mW | 115 W (with heatsink) |
| Maximum Junction Temperature | Tj(max) | Absolute maximum crystal temperature | +150°C | +200°C |
4. Temperature Parameters
| Parameter | Symbol | Description | Example |
|---|---|---|---|
| Vbe Temperature Coefficient | ΔVbe/ΔT | Change in B-E voltage with heating | −2 mV/°C |
| Junction-to-Ambient Thermal Resistance | Rθja | Thermal resistance from the crystal to ambient | 200 °C/W (TO-92) |
| Junction-to-Case Thermal Resistance | Rθjc | Thermal resistance from the crystal to case | 83.3 °C/W (TO-220) |
Interdependence of Bipolar Transistor Parameters
Parameter Interaction
| Influencing Parameter | Affects | Nature and Consequences of Influence |
|---|---|---|
| Current Gain (hFE, β) | Saturation Voltage Vce(sat) Input Impedance hie Temperature Stability Gain Spread |
Low β increases Vce(sat), requires higher base current. High β increases hie. High β enhances temperature dependence. Large technological spread of β (e.g., from 100 to 400) complicates mass production of circuits, requires worst-case design or use of negative feedback. |
| Collector Current (Ic) | Input Impedance hie Transition Frequency fT |
hie decreases with increasing Ic. Relationship is nonlinear. Typically fT increases with Ic up to an optimum, after which it begins to fall. |
| Collector-Emitter Voltage (Vce) | Output Impedance roe Capacitance Ccb Power Dissipation Pc |
roe increases with Vce (Early effect). Ccb decreases with increasing reverse voltage. Pc = Ic × Vce, the main factor for heating. |
| Junction Temperature (Tj) | Voltage Vbe Gain β Leakage Currents Icbo |
Vbe decreases by ~2 mV/°C (risk of thermal runaway). β increases by approximately 0.5% / °C. Icbo increases exponentially with temperature. |
| Maximum Operating Temperature | Parameter drift over time Threshold voltage changes Connection reliability |
Long-term operation at elevated temperature causes irreversible changes in characteristics. Heating alters the band gap, affecting Vbe and leakage currents. Thermal cycling leads to material fatigue and contact degradation. |
| Transition Frequency (fT) | High-Frequency gain Switching speed |
Determines maximum amplification frequency: fmax ≈ fT/√2. High fT correlates with short switching time. |
| Collector-Base Capacitance (Ccb) | Frequency response Switching speed |
Acts as an internal feedback capacitance. Provides negative feedback from output to input, reducing HF gain and potentially causing oscillation in an amplifier. Large Ccb increases the base charge storage time during turn-off (t_off), slowing down the transistor switch. |
| Saturation Voltage Vce(sat) | Power dissipation in switching mode Heat generation |
Losses in the on-state: P_loss = Ic × Vce(sat). High Vce(sat) requires a larger heatsink. |
| Thermal Resistance (Rθja) | Actual maximum power Reliability and lifetime |
Determines temperature rise: ΔT = Pc × Rθja. Poor heat dissipation → high Tj → accelerated degradation and reduced transistor lifetime. |
| Noise Figure (NF) | Dynamic range Input stage sensitivity Bias point stability |
High noise figure limits the minimum detectable signal in low-noise amplifiers. Depends on collector current and frequency, has an optimum value at a certain Ic. In RF circuits, the noise figure is influenced by parasitic lead capacitances and inductances. |
| Emitter-Base Capacitance (Ceb) | HF input impedance Switching speed Amplifier stability |
Together with base resistance forms a low-pass filter, limiting bandwidth. In switching mode, affects the turn-on delay time (td). Large Ceb can lead to oscillation via internal feedback. |
| Lead Inductance | HF characteristics Switching noise spikes High-frequency stability |
Together with parasitic capacitances forms resonant circuits at HF. Causes voltage spikes during fast switching of large currents. Limits the maximum effective switching frequency. |
| Base Resistance (rb') | Noise characteristics Heating with HF signals Non-uniform turn-on |
Causes thermal noise, proportional to √rb'. Power dissipated in the base region, P = Ib² × rb'. In power transistors, leads to non-uniform current distribution across the die. |
| Storage Time (ts) | Maximum switching frequency Dynamic power losses Pulse edge shaping |
Determines the minimum control pulse width for guaranteed turn-off. During ts the transistor remains partially on, increasing losses. Affects the output signal shape in pulse circuits. |
| Power Gain | Stage efficiency Thermal regime Gain stability |
Determines the number of stages needed to achieve a given output power. Low gain requires higher quiescent current or additional stages. Depends on input and output impedance matching. |
| Breakdown Voltage with Open Base | Voltage margin in switching mode Protection against voltage spikes Reliability in inductive circuits |
Determines the need for snubber circuits when switching inductive loads. Affects the choice of supply voltage for reliability. Low breakdown voltage requires additional protective elements. |
Practical Consequences of Interdependencies
Amplifier Design
The operating point (Ic, Vce) determines hie and voltage gain. The product Ic × Vce must be controlled to comply with thermal limits.
Switching Mode
Requires a compromise between parameters:
- High β and large Ib for low Vce(sat)
- High fT and low Ccb for fast switching
- Low Vce(sat) to minimize losses
Temperature Stability
Temperature rise causes a chain reaction:
- Increase in β and Icbo
- Decrease in Vbe
- Avalanche increase in Ic (thermal runaway)
Solution: emitter degeneration and DC negative feedback.
High-Frequency Applications
Junction capacitances (Ccb, Cbe) become dominant, shunting the input and creating feedback. High fT and specialized package topology are important.
Key Takeaways
Transistor parameters are closely interrelated and require trade-offs in design. Understanding these interdependencies allows for correct transistor selection and the development of stable, efficient circuits.
Always consult the official datasheet for the specific transistor model, as parameters can vary significantly.
BJT Parameters and How They Relate
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